Fields:Publications/MethodIntro
Method Paper Introduction Rough
Though not an especially new technology, silicon detectors remain unavailable as commercially mass-produced items. Researchers who want to use silicon detectors must place special orders with established silicon device fabricators. As no comprehensive system of quality control is in place, researchers must test all detectors individually to make sure of their quality and working tolerances. All silicon detectors make use of the P-N junction in various geometries according to taste in design. When a reverse bias voltage is applied over all the junctions, the entire detector becomes depleted past a certain voltage threshold, depending on the detector. One can vary layout of junctions to create multiple zones covering the entire detector where, once the detector has been fully depleted, a charged particle can trigger current spikes in individual strip channels. This localizes the position of the particle.
The prototype Forward Vertex Detector component silicon detectors are single-sided, meaning one side is sheathed in {METAL} while its opposite holds parallel strips of {TYPE} silicon, creating individual areas for high-resolution 2D path detection. Each strip is connected to a bias ring circumscribing and connecting to all strips via individual {polysilicon??} resistors for each strip. A second ground ring circumscribes the bias ring to provide additional measures for full detector depletion. A dielectric covering is applied over the surface with the exception of both directly- and capacitively-coupled testing pads. These pads allow researchers to probe each strip individually, or to test the detector as a whole for salient properties: leakage current, bulk capacitance, coupling capacitance, interstrip resistance, bulk breakdown voltage, and coupling capacitor breakdown voltage.
The prototypes in question, Hamamatsu S10938, arrive pre-tested for a variety of problems. In order to verify the quality and specifications of each detector, as well as the quality of testing by the manufacturer, we engage in a series of tests to determine all the salient qualities outlined above.
