Biomod/2013/OSU/protocol/atomic force microscopy

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Atomic Force Microscopy

One mode of the AFM is the intermittent contact mode in which the cantilever is oscillated in a particular resonance frequency. When the probe is in close contact with the sample, the amplitude of the resonance changes and can be measured. This method is what we used due to its ability to measure weakly adhered nanoparticles. Eventually a topographic image can be generated of the specimen. Keep in mind that the lateral dimensions of the particle are influenced by the shape of the probe, but the height measurement can be well corresponded to the diameter size.
I will be using the Alysum MFP-3D system. See website [1] and probe [2].

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